Publications from Facility Users
2012 |2011-2010 |2009 | 2008-2007 | 2006 | 2005
EBSD data of large grains and correlated grain orientationin three adjacent Cu lines with widths from left 45, 40, 35, 30, and 25 nm and with a Ta barrier. Line colors correspond to the orientation normal to the sample surface, according to the triangle.
- C. Peroz, C. Calo, A. Goltsov, S. Dhuey, A. Koshelev, P. Sasorov, I. Ivonin, S. Babin, S. Cabrini, V. Yankov, "Multiband wavelength demultiplexer based on digital planar holography for on-chip spectroscopy applications," Optics Letters 37, 695 (2012). [pdf]
