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substrateEBSD data of large grains and correlated grain orientation
in three adjacent Cu lines with widths from left 45, 40, 35, 30, and 25 nm and with a Ta barrier. Line colors correspond to the orientation normal to the sample surface, according to the triangle.
  1. C. Peroz, C. Calo, A. Goltsov, S. Dhuey, A. Koshelev, P. Sasorov, I. Ivonin, S. Babin, S. Cabrini, V. Yankov, "Multiband wavelength demultiplexer based on digital planar holography for on-chip spectroscopy applications," Optics Letters 37, 695 (2012). [pdf]